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Cr2SiO4 |
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Miletich R, Nowak M, Seifert F, Angel R J, Brandstatter G |
| |
Physics and Chemistry of Minerals 26 (1999) 446-459 |
|
High-pressure crystal chemistry of chromous orthosilicate, Cr2SiO4. |
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A single-crystal X-ray diffraction and electronic absorption |
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spectroscopy study |
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Sample in air: P = 0.0001 GPa |
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_database_code_amcsd 0008222 |
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5.7005 11.1651 9.5847 90 90 90 *Fddd |
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.125 .125 .125 |
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atom x y z Biso B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
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Cr 1/8 1/8 .48166 .93 .00572 .00137 .00372 .00015 0 0 |
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Si 1/8 1/8 1/8 .73 .00505 .00129 .00240 0 0 0 |
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O -.04364 .04919 .22985 .95 .00630 .00170 .00320 -.00036 .00058 .00025 |
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| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
|
Cr2SiO4 |
| |
Miletich R, Nowak M, Seifert F, Angel R J, Brandstatter G |
| |
Physics and Chemistry of Minerals 26 (1999) 446-459 |
|
High-pressure crystal chemistry of chromous orthosilicate, Cr2SiO4. |
|
A single-crystal X-ray diffraction and electronic absorption |
|
spectroscopy study |
|
Sample in diamond anvil cell: P = 0.0001 GPa |
|
_database_code_amcsd 0008223 |
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5.7007 11.1653 9.5850 90 90 90 *Fddd |
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.125 .125 .125 |
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atom x y z Biso B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
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Cr 1/8 1/8 .48148 .96 .00568 .00137 .00400 .00034 0 0 |
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Si 1/8 1/8 1/8 .73 .00507 .00129 .00244 0 0 0 |
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O -.0434 .0484 .2304 .96 .00635 .00170 .00330 -.00015 .00058 -.00059 |
|
|
| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
|
Cr2SiO4 |
| |
Miletich R, Nowak M, Seifert F, Angel R J, Brandstatter G |
| |
Physics and Chemistry of Minerals 26 (1999) 446-459 |
|
High-pressure crystal chemistry of chromous orthosilicate, Cr2SiO4. |
|
A single-crystal X-ray diffraction and electronic absorption |
|
spectroscopy study |
|
Sample: P = 3.106 GPa |
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_database_code_amcsd 0008224 |
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5.6804 11.1174 9.3842 90 90 90 *Fddd |
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.125 .125 .125 |
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atom x y z Biso B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
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Cr 1/8 1/8 .48147 .93 .00643 .00137 .00366 .00022 0 0 |
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Si 1/8 1/8 1/8 .76 .00519 .00129 .00278 0 0 0 |
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O -.0424 .0501 .2314 .98 .00513 .00170 .00410 -.00017 .00039 -.00008 |
|
|
| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
|
Cr2SiO4 |
| |
Miletich R, Nowak M, Seifert F, Angel R J, Brandstatter G |
| |
Physics and Chemistry of Minerals 26 (1999) 446-459 |
|
High-pressure crystal chemistry of chromous orthosilicate, Cr2SiO4. |
|
A single-crystal X-ray diffraction and electronic absorption |
|
spectroscopy study |
|
Sample: P = 5.303 GPa |
|
_database_code_amcsd 0008225 |
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5.6650 11.0863 9.2742 90 90 90 *Fddd |
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.125 .125 .125 |
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atom x y z Biso B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
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Cr 1/8 1/8 .48120 .89 .00620 .00137 .00351 -.00013 0 0 |
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Si 1/8 1/8 1/8 .73 .00575 .00129 .00234 0 0 0 |
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O -.0415 .0492 .2336 1.0 .00706 .00170 .00363 -.00260 .00054 -.00005 |
|
|
| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
|
Cr2SiO4 |
| |
Miletich R, Nowak M, Seifert F, Angel R J, Brandstatter G |
| |
Physics and Chemistry of Minerals 26 (1999) 446-459 |
|
High-pressure crystal chemistry of chromous orthosilicate, Cr2SiO4. |
|
A single-crystal X-ray diffraction and electronic absorption |
|
spectroscopy study |
|
Sample: P = 7.300 GPa |
|
_database_code_amcsd 0008226 |
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5.6512 11.0598 9.1910 90 90 90 *Fddd |
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.125 .125 .125 |
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atom x y z Biso B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
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Cr 1/8 1/8 .48137 .88 .00640 .00137 .00341 -.00100 0 0 |
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Si 1/8 1/8 1/8 .70 .00541 .00129 .00233 0 0 0 |
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O -.0425 .0502 .2344 .96 .00697 .00170 .00346 -.00084 .00053 .00047 |
|
|
| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
|
Cr2SiO4 |
| |
Miletich R, Nowak M, Seifert F, Angel R J, Brandstatter G |
| |
Physics and Chemistry of Minerals 26 (1999) 446-459 |
|
High-pressure crystal chemistry of chromous orthosilicate, Cr2SiO4. |
|
A single-crystal X-ray diffraction and electronic absorption |
|
spectroscopy study |
|
Sample: P = 9.220 GPa |
|
_database_code_amcsd 0008227 |
|
5.6374 11.0375 9.1192 90 90 90 *Fddd |
|
.125 .125 .125 |
|
atom x y z Biso B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
|
Cr 1/8 1/8 .48168 .82 .00606 .00137 .00308 -.00016 0 0 |
|
Si 1/8 1/8 1/8 .71 .00635 .00129 .00209 0 0 0 |
|
O -.0417 .0494 .2356 .94 .00745 .00170 .00318 -.00313 .00110 -.00056 |
|
|
| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
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