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Topaz |
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Chen J, Lager G A, Kunz M, Hansen T C, Ulmer P |
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Acta Crystallographica E61 (2005) i253-i255 |
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A Rietveld refinement using neutron powder diffraction data of a |
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fully deuterated topaz, Al2SiO4(OD)2 |
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Locality: synthetic |
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_database_code_amcsd 0010464 |
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4.72820 8.9320 8.4309 90 90 90 Pbnm |
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atom x y z occ Uiso |
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Al .9071 .1325 .0779 .0030 |
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Si .4032 .9404 .25 .0002 |
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O1 .7080 .0260 .25 .0015 |
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O2 .4431 .7551 .25 .0017 |
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O3 .2129 .9922 .0946 .0031 |
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O4 .5917 .2504 .0661 .0048 |
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D1 .4400 .1858 .1031 .5 .0450 |
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D2 .5320 .2811 .1675 .5 .0480 |
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