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NiS |
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Trahan J, Goodrich R G, Watkins S F |
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Physical Review B 2 (1970) 2859-2863 |
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X-ray diffraction measurements on metallic and semiconducting hexagonal NiS |
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Note: T = 77 K |
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_database_code_amcsd 0015158 |
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3.4456 3.4456 5.405 90 90 120 P6_3mc |
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atom x y z B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
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Ni 0 0 0 .044 .044 .031 .022 0 0 |
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S 1/3 2/3 .275 -.015 -.015 -.004 -.0075 0 0 |
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| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
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| |
|
NiS |
| |
Trahan J, Goodrich R G, Watkins S F |
| |
Physical Review B 2 (1970) 2859-2863 |
|
X-ray diffraction measurements on metallic and semiconducting hexagonal NiS |
|
Note: T = 300 K |
|
_database_code_amcsd 0015159 |
|
3.4395 3.4395 5.3514 90 90 120 P6_3/mmc |
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atom x y z B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) |
|
Ni 0 0 0 .054 .054 .038 .027 0 0 |
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S 1/3 2/3 .25 -.004 -.004 -.004 -.002 0 0 |
|
|
| Download AMC data (View Text File)
Download CIF data (View Text File)
Download diffraction data (View Text File)
View JMOL 3-D Structure
|
| |
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