Topaz
Chen J, Lager G A, Kunz M, Hansen T C, Ulmer P
Acta Crystallographica E61 (2005) i253-i255
A Rietveld refinement using neutron powder diffraction data of a
fully deuterated topaz, Al2SiO4(OD)2
Locality: synthetic
_database_code_amcsd 0010464
4.72820 8.9320 8.4309 90 90 90 Pbnm
atom     x     y     z occ  Uiso
Al   .9071 .1325 .0779     .0030
Si   .4032 .9404   .25     .0002
O1   .7080 .0260   .25     .0015
O2   .4431 .7551   .25     .0017
O3   .2129 .9922 .0946     .0031
O4   .5917 .2504 .0661     .0048
D1   .4400 .1858 .1031  .5 .0450
D2   .5320 .2811 .1675  .5 .0480