Silicon
      Hom T, Kiszenick W, Post B
      Journal of Applied Crystallography 8 (1975) 457-458
      Accurate lattice constants from multiple reflection mesurements II.
      lattice constants of germanium, silicon and diamond
      Locality: synthetic
      Sample: at T = 25 C
      _database_code_amcsd 0012843

      CELL PARAMETERS:    5.4309   5.4309   5.4309   90.000   90.000   90.000
      SPACE GROUP: Fd3m      
      X-RAY WAVELENGTH:     1.541838
      Cell Volume:    160.186
      Density (g/cm3):      2.329
      MAX. ABS. INTENSITY / VOLUME**2:      32.66716109    
      RIR:      4.567
      RIR based on corundum from Acta Crystallographica A38 (1982) 733-739
               2-THETA      INTENSITY    D-SPACING   H   K   L   Multiplicity
                28.47        100.00        3.1356    1   1   1         8
                47.34         64.31        1.9201    2   2   0        12
                56.17         37.32        1.6375    3   1   1        24
                69.19          9.58        1.3577    4   0   0         6
                76.45         14.14        1.2459    3   3   1        24
                88.12         19.38        1.1086    4   2   2        24
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       XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs
  For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.