Forsterite
Yamazaki S, Toraya H
Journal of Applied Crystallography 32 (1999) 51-59
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
using a new weight function in least-squares fitting
Note: e = 1
Locality: synthetic
_database_code_amcsd 0019684
10.20141 5.98348 4.75534 90 90 90 Pnma
atom     x     y     z Biso
MgM1     0     0     0 1.06
MgM2 .2772   .25 .9914 1.01
Si   .0937   .25 .4260  .89
O1   .0909   .25 .7627  .89
O2   .4494   .25 .2204 1.03
O3   .1615 .0366 .2782 1.13