Tephroite Yamazaki S, Toraya H Journal of Applied Crystallography 32 (1999) 51-59 Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Locality: synthetic _database_code_amcsd 0019690 10.52411 6.17903 4.83927 90 90 90 Pnma atom x y z occ Biso MnM1 0 0 0 .513 .87 MgM1 0 0 0 .487 .87 MnM2 .2796 .25 .9875 .887 .85 MgM2 .2796 .25 .9875 .113 .85 Si .0936 .25 .4247 .62 O1 .0893 .25 .7549 .95 O2 .4533 .25 .2197 .67 O3 .1603 .0409 .2809 .73