Tephroite Yamazaki S, Toraya H Journal of Applied Crystallography 32 (1999) 51-59 Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Locality: synthetic _database_code_amcsd 0019692 10.60016 6.25753 4.90338 90 90 90 Pnma atom x y z Biso MnM1 0 0 0 1.02 MnM2 .2799 .25 .9875 .93 Si .0968 .25 .4278 .74 O1 .0920 .25 .7527 1.02 O2 .4570 .25 .2131 .80 O3 .1621 .0469 .2865 1.19