Tephroite
Yamazaki S, Toraya H
Journal of Applied Crystallography 32 (1999) 51-59
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
using a new weight function in least-squares fitting
Note: e = eo
Locality: synthetic
_database_code_amcsd 0019693
10.60016 6.25753 4.90338 90 90 90 Pnma
atom     x     y     z Biso
MnM1     0     0     0  .93
MnM2 .2803   .25 .9880  .83
Si   .0966   .25 .4275  .71
O1   .0931   .25 .7577 1.00
O2   .4560   .25 .2110  .63
O3   .1636 .0417 .2874  .93