Diopside Gualtieri A F Journal of Applied Crystallography 33 (2000) 267-278 Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Napoli, Italy _database_code_amcsd 0012864 9.7504 8.9015 5.27444 90 106.016 90 C2/c atom x y z occ Uiso Ca2 0 .2958 .25 .025 Mg1 0 .9075 .25 .74 .020 Fe1 0 .9075 .25 .25 .020 Si .2901 .0850 .2393 .024 O1 .1128 .0900 .1319 .029 O2 .3720 .2493 .3375 .057 O3 .3451 .0222 .0032 .015