Illite Gualtieri A F Journal of Applied Crystallography 33 (2000) 267-278 Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Napoli, Italy _database_code_amcsd 0012865 5.2226 9.0183 20.143 90 95.665 90 C2/c atom x y z Uiso K 0 .0901 .25 .075 Al1 .4432 .2635 .1365 .011 Al2 .2586 .0828 .0068 .027 Si .4825 .9297 .1370 .022 O1 .4623 .9194 .0505 .015 O2 .3835 .2665 .0663 .047 O3 .4259 .1039 .1530 .012 O4 .2226 .8368 .1685 .041 O5 .2735 .3722 .1678 .080 O6 .4080 .5671 .0454 .053