NiS Trahan J, Goodrich R G, Watkins S F Physical Review B2 (1970) 2859-2863 X-ray diffraction measurements on metallic and semiconducting hexagonal NiS Note: T = 77 K _database_code_amcsd 0015158 3.4456 3.4456 5.405 90 90 120 P6_3mc atom x y z B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) Ni 0 0 0 .044 .044 .031 .022 0 0 S 1/3 2/3 .275 -.015 -.015 -.004 -.0075 0 0