NiS Trahan J, Goodrich R G, Watkins S F Physical Review B2 (1970) 2859-2863 X-ray diffraction measurements on metallic and semiconducting hexagonal NiS Note: T = 77 K _database_code_amcsd 0015158 CELL PARAMETERS: 3.4456 3.4456 5.4050 90.000 90.000 120.000 SPACE GROUP: P6_3mc X-RAY WAVELENGTH: 1.541838 Cell Volume: 55.572 Density (g/cm3): 5.423 MAX. ABS. INTENSITY / VOLUME**2: 83.97083587 RIR: 5.042 RIR based on corundum from Acta Crystallographica A38 (1982) 733-739 2-THETA INTENSITY D-SPACING H K L Multiplicity 29.94 64.60 2.9840 1 0 0 6 33.15 8.08 2.7025 0 0 2 1 34.33 33.56 2.6123 1 0 1 6 45.27 100.00 2.0031 1 0 2 6 53.16 41.12 1.7228 1 1 0 6 59.98 4.91 1.5423 1 0 3 6 62.22 4.74 1.4920 2 0 0 6 64.10 3.92 1.4527 1 1 2 6 64.83 3.75 1.4382 2 0 1 6 69.57 4.35 1.3513 0 0 4 1 72.35 15.94 1.3062 2 0 2 6 77.55 4.23 1.2309 1 0 4 6 84.27 1.64 1.1491 2 0 3 6 ================================================================================ XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.