NiS Trahan J, Goodrich R G, Watkins S F Physical Review B2 (1970) 2859-2863 X-ray diffraction measurements on metallic and semiconducting hexagonal NiS Note: T = 300 K _database_code_amcsd 0015159 3.4395 3.4395 5.3514 90 90 120 P6_3/mmc atom x y z B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3) Ni 0 0 0 .054 .054 .038 .027 0 0 S 1/3 2/3 .25 -.004 -.004 -.004 -.002 0 0