NiS
      Trahan J, Goodrich R G, Watkins S F
      Physical Review B2 (1970) 2859-2863
      X-ray diffraction measurements on metallic and semiconducting hexagonal NiS
      Note: T = 300 K
      _database_code_amcsd 0015159

      CELL PARAMETERS:    3.4395   3.4395   5.3514   90.000   90.000  120.000
      SPACE GROUP: P6_3/mmc  
      X-RAY WAVELENGTH:     1.541838
      Cell Volume:     54.826
      Density (g/cm3):      5.497
      MAX. ABS. INTENSITY / VOLUME**2:      81.66483853    
      RIR:      4.837
      RIR based on corundum from Acta Crystallographica A38 (1982) 733-739
               2-THETA      INTENSITY    D-SPACING   H   K   L   Multiplicity
                30.00         65.44        2.9787    1   0   0         6
                33.49          6.25        2.6757    0   0   2         2
                34.46         35.02        2.6027    1   0   1        12
                45.57        100.00        1.9905    1   0   2        12
                53.27         40.94        1.7198    1   1   0         6
                60.50          5.04        1.5304    1   0   3        12
                62.35          4.27        1.4893    2   0   0         6
                64.40          2.37        1.4467    1   1   2        12
                65.00          3.92        1.4348    2   0   1        12
                70.37          4.44        1.3378    0   0   4         2
                72.66         15.12        1.3013    2   0   2        12
                78.35          2.68        1.2204    1   0   4        12
                84.80          1.70        1.1433    2   0   3        12
                88.81          1.01        1.1017    2   1   1        24
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       XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs
  For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.