Hom T, Kiszenick W, Post B
Journal of Applied Crystallography 8 (1975) 457-458
Accurate lattice constants from multiple reflection mesurements II.
lattice constants of germanium, silicon and diamond
Locality: synthetic
Sample: at T = 25 C
_database_code_amcsd 0012844
5.657820 5.657820 5.657820 90 90 90 Fd3m
atom x y z
Ge 0 0 0
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