Tephroite
	Yamazaki S, Toraya H
	Journal of Applied Crystallography 32 (1999) 51-59
	Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
	using a new weight function in least-squares fitting
	Note: e = eo
	Locality: synthetic
	_database_code_amcsd 0019691
	10.52411 6.17903 4.83927 90 90 90 Pnma
	atom x y z occ Biso
	MnM1 0 0 0 .489 .69
	MgM1 0 0 0 .511 .69
	MnM2 .2801 .25 .9878 .911 .87
	MgM2 .2801 .25 .9878 .089 .87
	Si .0939 .25 .4248 .60
	O1 .0890 .25 .7564 .92
	O2 .4519 .25 .2181 .71
	O3 .1605 .0394 .2824 .68
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