Tephroite
	Yamazaki S, Toraya H
	Journal of Applied Crystallography 32 (1999) 51-59
	Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
	using a new weight function in least-squares fitting
	Note: e = 1
	Locality: synthetic
	_database_code_amcsd 0019692
	10.60016 6.25753 4.90338 90 90 90 Pnma
	atom x y z Biso
	MnM1 0 0 0 1.02
	MnM2 .2799 .25 .9875 .93
	Si .0968 .25 .4278 .74
	O1 .0920 .25 .7527 1.02
	O2 .4570 .25 .2131 .80
	O3 .1621 .0469 .2865 1.19
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