Schneider J, Schulz H
Zeitschrift fur Kristallographie 203 (1993) 1-15
X-ray powder diffraction of Ag2Te at temperatures up to 1123 K
Locality: synthetic
Note: T = 297 K
8.16160 4.46651 8.97335 90 124.1528 90 P2_1/c
atom x y z B(1,1) B(2,2) B(3,3) B(1,2) B(1,3) B(2,3)
Ag1 .0190 .1496 .3714 .0111 .020 .0054 -.001 .0048 .000
Ag2 .3327 .8404 .9967 .0097 .041 .0073 .005 .0018 -.0052
Te .2712 .1601 .2425 .0046 .007 .0039 -.0008 .0021 .0000
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