Illite
	Gualtieri A F
	Journal of Applied Crystallography 33 (2000) 267-278
	Accuracy of XRPD QPA using the combined Rietveld-RIR method
	Locality: Napoli, Italy
	5.2226 9.0183 20.143 90 95.665 90 C2/c
	atom x y z Uiso
	K 0 .0901 .25 .075
	Al1 .4432 .2635 .1365 .011
	Al2 .2586 .0828 .0068 .027
	Si .4825 .9297 .1370 .022
	O1 .4623 .9194 .0505 .015
	O2 .3835 .2665 .0663 .047
	O3 .4259 .1039 .1530 .012
	O4 .2226 .8368 .1685 .041
	O5 .2735 .3722 .1678 .080
	O6 .4080 .5671 .0454 .053
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