Retgersite
Rousseau B, Maes S T, Lenstra A T H
Acta Crystallographica A56 (2000) 300-307
Systematic intensity errors and model imperfection
as the consequence of spectral truncation
Locality: synthetic
_database_code_amcsd 0009334
6.782 6.782 18.274 90 90 90 P4_12_12
atom      x      y      z  Biso
Ni   .71056 .71056      0 1.120
S    .20934 .20934      0 1.300
O1    .1209  .1202 .06583  2.46
O2    .4236  .1730 .00038  2.18
Ow1   .6729  .4533 .05275  2.29
Ow2   .9704  .7446 .05613  1.76
Ow3   .5659  .8562 .08495  1.67
H1w1   .596   .373   .042   3.5
H1w2   .732   .429   .082   4.3
H2w1   .048   .663   .049   2.4
H2w2   .028   .848   .061   2.8
H3w1   .511   .944   .071   3.3
H3w2   .500   .786   .113   2.2