data_global
_chemical_name_mineral 'Tephroite'
loop_
_publ_author_name
'Yamazaki S'
'Toraya H'
_journal_name_full 'Journal of Applied Crystallography'
_journal_volume 32 
_journal_year 1999
_journal_page_first 51
_journal_page_last 59
_publ_section_title
;
 Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
 using a new weight function in least-squares fitting
 Note: e = 1
;
_database_code_amcsd 0019690
_chemical_compound_source 'Synthetic'
_chemical_formula_sum '(Mn1.4 Mg.6) Si O4'
_cell_length_a 10.52411
_cell_length_b 6.17903
_cell_length_c 4.83927
_cell_angle_alpha 90
_cell_angle_beta 90
_cell_angle_gamma 90
_cell_volume 314.692
_exptl_crystal_density_diffrn      3.875
_symmetry_space_group_name_H-M 'P n m a'
loop_
_space_group_symop_operation_xyz
  'x,y,z'
  'x,1/2-y,z'
  '-x,1/2+y,-z'
  '1/2-x,1/2+y,1/2+z'
  '1/2+x,1/2-y,1/2-z'
  '1/2+x,y,1/2-z'
  '1/2-x,-y,1/2+z'
  '-x,-y,-z'
loop_
_atom_site_label
_atom_site_fract_x
_atom_site_fract_y
_atom_site_fract_z
_atom_site_occupancy
_atom_site_U_iso_or_equiv
MnM1   0.00000   0.00000   0.00000   0.51300   0.01102
MgM1   0.00000   0.00000   0.00000   0.48700   0.01102
MnM2   0.27960   0.25000   0.98750   0.88700   0.01077
MgM2   0.27960   0.25000   0.98750   0.11300   0.01077
Si   0.09360   0.25000   0.42470   1.00000   0.00785
O1   0.08930   0.25000   0.75490   1.00000   0.01203
O2   0.45330   0.25000   0.21970   1.00000   0.00849
O3   0.16030   0.04090   0.28090   1.00000   0.00925