Tephroite
Yamazaki S, Toraya H
Journal of Applied Crystallography 32 (1999) 51-59
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
using a new weight function in least-squares fitting
Note: e = eo
Locality: synthetic
_database_code_amcsd 0019691
10.52411 6.17903 4.83927 90 90 90 Pnma
atom     x     y     z  occ Biso
MnM1     0     0     0 .489  .69
MgM1     0     0     0 .511  .69
MnM2 .2801   .25 .9878 .911  .87
MgM2 .2801   .25 .9878 .089  .87
Si   .0939   .25 .4248       .60
O1   .0890   .25 .7564       .92
O2   .4519   .25 .2181       .71
O3   .1605 .0394 .2824       .68