data_global
_chemical_name_mineral 'Tephroite'
loop_
_publ_author_name
'Yamazaki S'
'Toraya H'
_journal_name_full 'Journal of Applied Crystallography'
_journal_volume 32 
_journal_year 1999
_journal_page_first 51
_journal_page_last 59
_publ_section_title
;
 Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4
 using a new weight function in least-squares fitting
 Note: e = 1
;
_database_code_amcsd 0019692
_chemical_compound_source 'Synthetic'
_chemical_formula_sum 'Mn2 Si O4'
_cell_length_a 10.60016
_cell_length_b 6.25753
_cell_length_c 4.90338
_cell_angle_alpha 90
_cell_angle_beta 90
_cell_angle_gamma 90
_cell_volume 325.245
_exptl_crystal_density_diffrn      4.124
_symmetry_space_group_name_H-M 'P n m a'
loop_
_space_group_symop_operation_xyz
  'x,y,z'
  'x,1/2-y,z'
  '-x,1/2+y,-z'
  '1/2-x,1/2+y,1/2+z'
  '1/2+x,1/2-y,1/2-z'
  '1/2+x,y,1/2-z'
  '1/2-x,-y,1/2+z'
  '-x,-y,-z'
loop_
_atom_site_label
_atom_site_fract_x
_atom_site_fract_y
_atom_site_fract_z
_atom_site_U_iso_or_equiv
MnM1   0.00000   0.00000   0.00000   0.01292
MnM2   0.27990   0.25000   0.98750   0.01178
Si   0.09680   0.25000   0.42780   0.00937
O1   0.09200   0.25000   0.75270   0.01292
O2   0.45700   0.25000   0.21310   0.01013
O3   0.16210   0.04690   0.28650   0.01507