Sanidine
Gualtieri A F
Journal of Applied Crystallography 33 (2000) 267-278
Accuracy of XRPD QPA using the combined Rietveld-RIR method
Locality: Latera, Viterbo, Italy
_database_code_amcsd 0012862
8.53573 13.03129 7.17536 90 115.9855 90 C2/m
atom     x     y     z occ Uiso
K    .2840     0 .1371     .027
Al1  .0093 .1844 .2238 .25 .010
Si1  .0093 .1844 .2238 .75 .010
Al2  .7076 .1177 .3443 .25 .011
Si2  .7076 .1177 .3443 .75 .011
O1       0 .1461     0     .023
O2   .6340     0 .2855     .019
O3   .8277 .1454 .2278     .020
O4   .0338 .3098 .2577     .025
O5   .1812 .1264 .4052     .024