Illite
Gualtieri A F
Journal of Applied Crystallography 33 (2000) 267-278
Accuracy of XRPD QPA using the combined Rietveld-RIR method
Locality: Napoli, Italy
_database_code_amcsd 0012865
5.2226 9.0183 20.143 90 95.665 90 C2/c
atom     x     y     z Uiso
K        0 .0901   .25 .075
Al1  .4432 .2635 .1365 .011
Al2  .2586 .0828 .0068 .027
Si   .4825 .9297 .1370 .022
O1   .4623 .9194 .0505 .015
O2   .3835 .2665 .0663 .047
O3   .4259 .1039 .1530 .012
O4   .2226 .8368 .1685 .041
O5   .2735 .3722 .1678 .080
O6   .4080 .5671 .0454 .053