Retgersite
	Rousseau B, Maes S T, Lenstra A T H
	Acta Crystallographica A56 (2000) 300-307
	Systematic intensity errors and model imperfection
	as the consequence of spectral truncation
	Locality: synthetic
	_database_code_amcsd 0009334
	6.782 6.782 18.274 90 90 90 P4_12_12
	atom x y z Biso
	Ni .71056 .71056 0 1.120
	S .20934 .20934 0 1.300
	O1 .1209 .1202 .06583 2.46
	O2 .4236 .1730 .00038 2.18
	Ow1 .6729 .4533 .05275 2.29
	Ow2 .9704 .7446 .05613 1.76
	Ow3 .5659 .8562 .08495 1.67
	H1w1 .596 .373 .042 3.5
	H1w2 .732 .429 .082 4.3
	H2w1 .048 .663 .049 2.4
	H2w2 .028 .848 .061 2.8
	H3w1 .511 .944 .071 3.3
	H3w2 .500 .786 .113 2.2
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